APA引文

Lau, F. L., & Lip, G. C. (2011). Physical and electrical failure analysis of Cu/low k interconnect system.

Chicago Style Citation

Lau, Fu Long., and Gan Chee Lip. Physical and Electrical Failure Analysis of Cu/low K Interconnect System. 2011.

MLA引文

Lau, Fu Long., and Gan Chee Lip. Physical and Electrical Failure Analysis of Cu/low K Interconnect System. 2011.

警告：這些引文格式不一定是100％准確.