TEM image simulation of silicon nitride using multislice technique
In Transmission Electron Microscopy (TEM), high resolution images require comparison with simulated images as artifacts are usually generated experimentally. Hence, the objective of this project is to simulate TEM image of beta phase silicon nitride (β-Si3N4) by using multislice method and determine...
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| 主要作者: | |
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| 格式: | Final Year Project |
| 語言: | English |
| 出版: |
2011
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| 主題: | |
| 在線閱讀: | http://hdl.handle.net/10356/44669 |
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| 機構: | Nanyang Technological University |
| 語言: | English |