Tan, X. L., & Seng, Y. K. (2011). Design and analysis of low-power, variation-tolerant match-line sense amplifiers for large capacity content addressable memories (CAMs) in 65 nm CMOS process.
استشهاد بنمط شيكاغوTan, Xiao Liang., و Yeo Kiat Seng. Design and Analysis of Low-power, Variation-tolerant Match-line Sense Amplifiers for Large Capacity Content Addressable Memories (CAMs) in 65 Nm CMOS Process. 2011.
MLA استشهادTan, Xiao Liang., و Yeo Kiat Seng. Design and Analysis of Low-power, Variation-tolerant Match-line Sense Amplifiers for Large Capacity Content Addressable Memories (CAMs) in 65 Nm CMOS Process. 2011.
تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.