APA引文

Tan, X. L., & Seng, Y. K. (2011). Design and analysis of low-power, variation-tolerant match-line sense amplifiers for large capacity content addressable memories (CAMs) in 65 nm CMOS process.

Chicago Style Citation

Tan, Xiao Liang., and Yeo Kiat Seng. Design and Analysis of Low-power, Variation-tolerant Match-line Sense Amplifiers for Large Capacity Content Addressable Memories (CAMs) in 65 Nm CMOS Process. 2011.

MLA引文

Tan, Xiao Liang., and Yeo Kiat Seng. Design and Analysis of Low-power, Variation-tolerant Match-line Sense Amplifiers for Large Capacity Content Addressable Memories (CAMs) in 65 Nm CMOS Process. 2011.