APA引文

Loo, X. S., & Seng, Y. K. (2012). De-embedding techniques for characterizing high frequency noise in nanometre CMOS devices.

Chicago Style Citation

Loo, Xi Sung., and Yeo Kiat Seng. De-embedding Techniques for Characterizing High Frequency Noise in Nanometre CMOS Devices. 2012.

MLA引文

Loo, Xi Sung., and Yeo Kiat Seng. De-embedding Techniques for Characterizing High Frequency Noise in Nanometre CMOS Devices. 2012.

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