Loo, X. S., & Seng, Y. K. (2012). De-embedding techniques for characterizing high frequency noise in nanometre CMOS devices.
استشهاد بنمط شيكاغوLoo, Xi Sung., و Yeo Kiat Seng. De-embedding Techniques for Characterizing High Frequency Noise in Nanometre CMOS Devices. 2012.
MLA استشهادLoo, Xi Sung., و Yeo Kiat Seng. De-embedding Techniques for Characterizing High Frequency Noise in Nanometre CMOS Devices. 2012.
تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.