Loo, X. S., & Seng, Y. K. (2012). De-embedding techniques for characterizing high frequency noise in nanometre CMOS devices.
Chicago Style CitationLoo, Xi Sung., and Yeo Kiat Seng. De-embedding Techniques for Characterizing High Frequency Noise in Nanometre CMOS Devices. 2012.
MLA CitationLoo, Xi Sung., and Yeo Kiat Seng. De-embedding Techniques for Characterizing High Frequency Noise in Nanometre CMOS Devices. 2012.
Warning: These citations may not always be 100% accurate.