Heryanto, A., & Leong, P. K. (2012). Effect of stress migration on electromigration for nano scale advanced interconnects.
استشهاد بنمط شيكاغوHeryanto, Anson, و Pey Kin Leong. Effect of Stress Migration On Electromigration for Nano Scale Advanced Interconnects. 2012.
MLA استشهادHeryanto, Anson, و Pey Kin Leong. Effect of Stress Migration On Electromigration for Nano Scale Advanced Interconnects. 2012.
تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.