Park, H. S., & Engineering, S. o. M. S. &. (2008). Back-end-of-line process reliability of advanced semiconductor technology.
استشهاد بنمط شيكاغوPark, Hun Sub., و School of Materials Science & Engineering. Back-end-of-line Process Reliability of Advanced Semiconductor Technology. 2008.
MLA استشهادPark, Hun Sub., و School of Materials Science & Engineering. Back-end-of-line Process Reliability of Advanced Semiconductor Technology. 2008.
تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.