APA引文

Park, H. S., & Engineering, S. o. M. S. &. (2008). Back-end-of-line process reliability of advanced semiconductor technology.

Chicago Style Citation

Park, Hun Sub., and School of Materials Science & Engineering. Back-end-of-line Process Reliability of Advanced Semiconductor Technology. 2008.

MLA引文

Park, Hun Sub., and School of Materials Science & Engineering. Back-end-of-line Process Reliability of Advanced Semiconductor Technology. 2008.

警告：這些引文格式不一定是100％准確.