Wong, C. P., & Alex, S. K. H. (2012). UV Raman studies of channel stress in transistors with embedded SiGe source and drain.
استشهاد بنمط شيكاغوWong, Choun Pei, و See Kai Hung Alex. UV Raman Studies of Channel Stress in Transistors With Embedded SiGe Source and Drain. 2012.
MLA استشهادWong, Choun Pei, و See Kai Hung Alex. UV Raman Studies of Channel Stress in Transistors With Embedded SiGe Source and Drain. 2012.
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