Wong, C. P., & Alex, S. K. H. (2012). UV Raman studies of channel stress in transistors with embedded SiGe source and drain.
Chicago Style CitationWong, Choun Pei, and See Kai Hung Alex. UV Raman Studies of Channel Stress in Transistors With Embedded SiGe Source and Drain. 2012.
MLA CitationWong, Choun Pei, and See Kai Hung Alex. UV Raman Studies of Channel Stress in Transistors With Embedded SiGe Source and Drain. 2012.
Warning: These citations may not always be 100% accurate.