APA引文

Wong, C. P., & Alex, S. K. H. (2012). UV Raman studies of channel stress in transistors with embedded SiGe source and drain.

Chicago Style Citation

Wong, Choun Pei, and See Kai Hung Alex. UV Raman Studies of Channel Stress in Transistors With Embedded SiGe Source and Drain. 2012.

MLA引文

Wong, Choun Pei, and See Kai Hung Alex. UV Raman Studies of Channel Stress in Transistors With Embedded SiGe Source and Drain. 2012.

警告：這些引文格式不一定是100％准確.