Glass frit hermetic encapsulation for harsh environment multi-chip module application

This research project aims to investigate the suitability of glass frit bonding for multi-chip module (MCM) package encapsulation that needs to operate at a high temperature of 300°C and high pressure of 207 MPa. Since glass has the potential to bond well to alumina due to the chemical compatibility...

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Main Author: Lim, Jun Zhang
Other Authors: Wong Chee Cheong
Format: Theses and Dissertations
Language:English
Published: 2014
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Online Access:https://hdl.handle.net/10356/59379
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Institution: Nanyang Technological University
Language: English
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spelling sg-ntu-dr.10356-593792023-03-04T16:39:13Z Glass frit hermetic encapsulation for harsh environment multi-chip module application Lim, Jun Zhang Wong Chee Cheong Gan Chee Lip School of Materials Science & Engineering DRNTU::Engineering::Materials::Electronic packaging materials This research project aims to investigate the suitability of glass frit bonding for multi-chip module (MCM) package encapsulation that needs to operate at a high temperature of 300°C and high pressure of 207 MPa. Since glass has the potential to bond well to alumina due to the chemical compatibility between the two materials, the use of glass frit for alumina to alumina bonding is considered a simple yet robust method that is often used for hermetic sealing of microelectronic packages. The materials used in the study were alumina substrate and bismuth-based glass frit paste 4115DS-1Ha from Asahi Glass Company (AGC). The study includes an initial characterisation of the glass frit, evaluation of the shear strength of the bonding, hermeticity test of the glass frit bonded MCM package and simulation on the high pressure testing on the package with glass frit. The average shear strength (shear test performed at 250°C) for samples after thermal aging at 300°C for 500 hours was 28.72 MPa. This value is approximately 3.6 times above the minimally required shear strength of 7.9 MPa according to the MIL-STD-883G specification. The hermeticity data of the sealed package after thermal aging at 300°C for 500 hours showed that the helium leak rate remained below the MIL-STD-883G specification of 5 × 10-8 atm cm3/s. This proves that glass frit bonding for MCM hermetic encapsulation for high temperature application is feasible. ANSYSTM simulation was carried out and results showed that cracks would not form on the glass frit layer upon pressurising the package at 207 MPa since the maximum principle stress is below the flexural strength of the AGC glass frit. MASTER OF ENGINEERING (MSE) 2014-05-02T08:16:23Z 2014-05-02T08:16:23Z 2013 2013 Thesis Lim, J. Z. (2013). Glass frit hermetic encapsulation for harsh environment multi-chip module application. Master’s thesis, Nanyang Technological University, Singapore. https://hdl.handle.net/10356/59379 10.32657/10356/59379 en 79 p. application/pdf
institution Nanyang Technological University
building NTU Library
continent Asia
country Singapore
Singapore
content_provider NTU Library
collection DR-NTU
language English
topic DRNTU::Engineering::Materials::Electronic packaging materials
spellingShingle DRNTU::Engineering::Materials::Electronic packaging materials
Lim, Jun Zhang
Glass frit hermetic encapsulation for harsh environment multi-chip module application
description This research project aims to investigate the suitability of glass frit bonding for multi-chip module (MCM) package encapsulation that needs to operate at a high temperature of 300°C and high pressure of 207 MPa. Since glass has the potential to bond well to alumina due to the chemical compatibility between the two materials, the use of glass frit for alumina to alumina bonding is considered a simple yet robust method that is often used for hermetic sealing of microelectronic packages. The materials used in the study were alumina substrate and bismuth-based glass frit paste 4115DS-1Ha from Asahi Glass Company (AGC). The study includes an initial characterisation of the glass frit, evaluation of the shear strength of the bonding, hermeticity test of the glass frit bonded MCM package and simulation on the high pressure testing on the package with glass frit. The average shear strength (shear test performed at 250°C) for samples after thermal aging at 300°C for 500 hours was 28.72 MPa. This value is approximately 3.6 times above the minimally required shear strength of 7.9 MPa according to the MIL-STD-883G specification. The hermeticity data of the sealed package after thermal aging at 300°C for 500 hours showed that the helium leak rate remained below the MIL-STD-883G specification of 5 × 10-8 atm cm3/s. This proves that glass frit bonding for MCM hermetic encapsulation for high temperature application is feasible. ANSYSTM simulation was carried out and results showed that cracks would not form on the glass frit layer upon pressurising the package at 207 MPa since the maximum principle stress is below the flexural strength of the AGC glass frit.
author2 Wong Chee Cheong
author_facet Wong Chee Cheong
Lim, Jun Zhang
format Theses and Dissertations
author Lim, Jun Zhang
author_sort Lim, Jun Zhang
title Glass frit hermetic encapsulation for harsh environment multi-chip module application
title_short Glass frit hermetic encapsulation for harsh environment multi-chip module application
title_full Glass frit hermetic encapsulation for harsh environment multi-chip module application
title_fullStr Glass frit hermetic encapsulation for harsh environment multi-chip module application
title_full_unstemmed Glass frit hermetic encapsulation for harsh environment multi-chip module application
title_sort glass frit hermetic encapsulation for harsh environment multi-chip module application
publishDate 2014
url https://hdl.handle.net/10356/59379
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