Poon, W. K., & Ang, H. E. (2008). Development of failure criterion and reliability model for plastic encapsulated microcircuits at elevated environment.
استشهاد بنمط شيكاغوPoon, Wai Kiong., و Hock Eng Ang. Development of Failure Criterion and Reliability Model for Plastic Encapsulated Microcircuits At Elevated Environment. 2008.
MLA استشهادPoon, Wai Kiong., و Hock Eng Ang. Development of Failure Criterion and Reliability Model for Plastic Encapsulated Microcircuits At Elevated Environment. 2008.
تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.