Poon, W. K., & Ang, H. E. (2008). Development of failure criterion and reliability model for plastic encapsulated microcircuits at elevated environment.
Chicago Style CitationPoon, Wai Kiong., and Hock Eng Ang. Development of Failure Criterion and Reliability Model for Plastic Encapsulated Microcircuits At Elevated Environment. 2008.
MLA CitationPoon, Wai Kiong., and Hock Eng Ang. Development of Failure Criterion and Reliability Model for Plastic Encapsulated Microcircuits At Elevated Environment. 2008.
Warning: These citations may not always be 100% accurate.