APA引文

Poon, W. K., & Ang, H. E. (2008). Development of failure criterion and reliability model for plastic encapsulated microcircuits at elevated environment.

Chicago Style Citation

Poon, Wai Kiong., and Hock Eng Ang. Development of Failure Criterion and Reliability Model for Plastic Encapsulated Microcircuits At Elevated Environment. 2008.

MLA引文

Poon, Wai Kiong., and Hock Eng Ang. Development of Failure Criterion and Reliability Model for Plastic Encapsulated Microcircuits At Elevated Environment. 2008.

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