APA引文

Richard D'Costa, V., Subramanian, S., Li, D., Wicaksono, S., Yoon, S. F., Tok, E. S., . . . Engineering, S. o. E. a. E. (2014). Infrared spectroscopic ellipsometry study of sulfur-doped In0.53Ga0.47As ultra-shallow junctions.

Chicago Style Citation

Richard D'Costa, Vijay, Sujith Subramanian, Daosheng Li, Satrio Wicaksono, Soon Fatt Yoon, Eng Soon Tok, Yee-Chia Yeo, and School of Electrical and Electronic Engineering. Infrared Spectroscopic Ellipsometry Study of Sulfur-doped In0.53Ga0.47As Ultra-shallow Junctions. 2014.

MLA引文

Richard D'Costa, Vijay, et al. Infrared Spectroscopic Ellipsometry Study of Sulfur-doped In0.53Ga0.47As Ultra-shallow Junctions. 2014.