Hybrid K -means clustering and support vector machine method for via and metal line detections in delayered IC images

• Main Authors: Cheng, Deruo, Shi, Yiqiong, Lin, Tong, Gwee, Bah-Hwee, Toh, Kar-Ann
• 其他作者: School of Electrical and Electronic Engineering
• 格式: Article
• 語言: English
• 出版: 2019
• 主題: IC Image Analysis; Support Vector Machine; Engineering::Electrical and electronic engineering
• 在線閱讀: https://hdl.handle.net/10356/81439; http://hdl.handle.net/10220/50385
• 機構: Nanyang Technological University

This brief proposes a hybrid K-means clustering and support vector machine (HKCSVM) method to detect the positions of vias and metal lines from delayered IC images for subsequent netlist extraction. The main contributions of the proposed method include: 1) fully automated detection of via and metal...