Tay, R. Y., Lin, J., Tsang, S. H., McCulloch, D. G., Teo, E. H. T., & Engineering, S. o. E. a. E. (2017). Probing the Atomic Structures of Synthetic Monolayer and Bilayer Hexagonal Boron Nitride Using Electron Microscopy.
استشهاد بنمط شيكاغوTay, Roland Yingjie, Jinjun Lin, Siu Hon Tsang, Dougal G. McCulloch, Edwin Hang Tong Teo, و School of Electrical and Electronic Engineering. Probing the Atomic Structures of Synthetic Monolayer and Bilayer Hexagonal Boron Nitride Using Electron Microscopy. 2017.
MLA استشهادTay, Roland Yingjie, et al. Probing the Atomic Structures of Synthetic Monolayer and Bilayer Hexagonal Boron Nitride Using Electron Microscopy. 2017.
تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.