Tay, R. Y., Lin, J., Tsang, S. H., McCulloch, D. G., Teo, E. H. T., & Engineering, S. o. E. a. E. (2017). Probing the Atomic Structures of Synthetic Monolayer and Bilayer Hexagonal Boron Nitride Using Electron Microscopy.
Chicago Style CitationTay, Roland Yingjie, Jinjun Lin, Siu Hon Tsang, Dougal G. McCulloch, Edwin Hang Tong Teo, and School of Electrical and Electronic Engineering. Probing the Atomic Structures of Synthetic Monolayer and Bilayer Hexagonal Boron Nitride Using Electron Microscopy. 2017.
MLA引文Tay, Roland Yingjie, et al. Probing the Atomic Structures of Synthetic Monolayer and Bilayer Hexagonal Boron Nitride Using Electron Microscopy. 2017.
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