Boo, A. A., Ang, D. S., & Engineering, S. o. E. a. E. (2013). Evolution of hole trapping in the oxynitride gate p-MOSFET subjected to negative-bias temperature stressing.
Chicago Style CitationBoo, A. A., Diing Shenp Ang, and School of Electrical and Electronic Engineering. Evolution of Hole Trapping in the Oxynitride Gate P-MOSFET Subjected to Negative-bias Temperature Stressing. 2013.
MLA引文Boo, A. A., Diing Shenp Ang, and School of Electrical and Electronic Engineering. Evolution of Hole Trapping in the Oxynitride Gate P-MOSFET Subjected to Negative-bias Temperature Stressing. 2013.
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