Failure analysis of damages on advanced technologies induced by picosecond pulsed laser during space radiation SEE testing

• Main Authors: Chua, C. T., Liu, Q., Chef, Samuel, Sanchez, K., Pcrdu, P., Gan, Chee Lip
• 其他作者: School of Materials Science & Engineering
• 格式: Article
• 語言: English
• 出版: 2019
• 主題: Pulsed Laser; 1064 nm; Engineering::Materials
• 在線閱讀: https://hdl.handle.net/10356/85475; http://hdl.handle.net/10220/50129

Picosecond pulsed laser, customarily perceived to offer advantages of flexibility and ease of testing over heavy ion particle accelerator test, was conducted on a chain of inverters during Single Event Effect (SEE) evaluation. In this paper, we report on the unexpected permanent damage induced by 10...