Ong, V. K. S., Tan, C. C., Radhakrishnan, K., & Engineering, S. o. E. a. E. (2010). Extraction of diffusion length using junction-less EBIC.
استشهاد بنمط شيكاغوOng, Vincent K. S., Chee Chin Tan, K. Radhakrishnan, و School of Electrical and Electronic Engineering. Extraction of Diffusion Length Using Junction-less EBIC. 2010.
MLA استشهادOng, Vincent K. S., Chee Chin Tan, K. Radhakrishnan, و School of Electrical and Electronic Engineering. Extraction of Diffusion Length Using Junction-less EBIC. 2010.
تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.