APA استشهاد

Xu, S., Lai, M. Y., Yakovlev, N. L., Law, S. B., Chen, Z., Ee, E. Y. C., & Engineering, S. o. M. S. &. (2012). Copper diffusion in Ti–Si–N layers formed by inductively coupled plasma implantation.

استشهاد بنمط شيكاغو

Xu, S., M. Y. Lai, N. L. Yakovlev, S. B. Law, Z. Chen, Elden Yong Chiang Ee, و School of Materials Science & Engineering. Copper Diffusion in Ti–Si–N Layers Formed By Inductively Coupled Plasma Implantation. 2012.

MLA استشهاد

Xu, S., et al. Copper Diffusion in Ti–Si–N Layers Formed By Inductively Coupled Plasma Implantation. 2012.

تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.