Text this: Reservoir effect and the role of low current density regions on electromigration lifetimes in copper interconnects

 _____     _    _    ______    _    _   __    __  
|  __ \\  | || | || |      \\ | || | || \ \\ / // 
| |  \ || | || | || |  --  // | || | ||  \ \/ //  
| |__/ || | \\_/ || |  --  \\ | \\_/ ||   \  //   
|_____//   \____//  |______//  \____//     \//    
 -----`     `---`   `------`    `---`       `