APA引文

Qin, H. L., Goh, K. E. J., Troadec, C., Bosman, M., Pey, K. L., & Engineering, S. o. E. a. E. (2013). The electronic barrier height of silicon native oxides at different oxidation stages.

Chicago Style Citation

Qin, H. L., K. E. J. Goh, C. Troadec, Michel Bosman, Kin Leong Pey, and School of Electrical and Electronic Engineering. The Electronic Barrier Height of Silicon Native Oxides At Different Oxidation Stages. 2013.

MLA引文

Qin, H. L., et al. The Electronic Barrier Height of Silicon Native Oxides At Different Oxidation Stages. 2013.