Shang, Y., Fei, W., Yu, H., & Engineering, S. o. E. a. E. (2012). Analysis and modeling of internal state variables for dynamic effects of nonvolatile memory devices.
Chicago Style CitationShang, Yang, Wei Fei, Hao Yu, and School of Electrical and Electronic Engineering. Analysis and Modeling of Internal State Variables for Dynamic Effects of Nonvolatile Memory Devices. 2012.
MLA引文Shang, Yang, Wei Fei, Hao Yu, and School of Electrical and Electronic Engineering. Analysis and Modeling of Internal State Variables for Dynamic Effects of Nonvolatile Memory Devices. 2012.
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