APA引文

Xu, G., Feng, Z., & SCIENCE, M. (2014). High order X-ray diffraction and internal atomic layer roughness of epitaxial and bulk SiC materials.

Chicago Style Citation

Xu, G., Z.C Feng, and MATERIALS SCIENCE. High Order X-ray Diffraction and Internal Atomic Layer Roughness of Epitaxial and Bulk SiC Materials. 2014.

MLA引文

Xu, G., Z.C Feng, and MATERIALS SCIENCE. High Order X-ray Diffraction and Internal Atomic Layer Roughness of Epitaxial and Bulk SiC Materials. 2014.

警告：這些引文格式不一定是100％准確.