Xu, G., Feng, Z., & SCIENCE, M. (2014). High order X-ray diffraction and internal atomic layer roughness of epitaxial and bulk SiC materials.
استشهاد بنمط شيكاغوXu, G., Z.C Feng, و MATERIALS SCIENCE. High Order X-ray Diffraction and Internal Atomic Layer Roughness of Epitaxial and Bulk SiC Materials. 2014.
MLA استشهادXu, G., Z.C Feng, و MATERIALS SCIENCE. High Order X-ray Diffraction and Internal Atomic Layer Roughness of Epitaxial and Bulk SiC Materials. 2014.
تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.