APA Citation

Xu, G., Feng, Z., & SCIENCE, M. (2014). High order X-ray diffraction and internal atomic layer roughness of epitaxial and bulk SiC materials.

Chicago Style Citation

Xu, G., Z.C Feng, and MATERIALS SCIENCE. High Order X-ray Diffraction and Internal Atomic Layer Roughness of Epitaxial and Bulk SiC Materials. 2014.

MLA Citation

Xu, G., Z.C Feng, and MATERIALS SCIENCE. High Order X-ray Diffraction and Internal Atomic Layer Roughness of Epitaxial and Bulk SiC Materials. 2014.

Warning: These citations may not always be 100% accurate.