Text this: High order X-ray diffraction and internal atomic layer roughness of epitaxial and bulk SiC materials

 _    _    __   __   _    _     ______    _____   
| |  | ||  \ \\/ // | \  / ||  /_   _//  / ____|| 
| |/\| ||   \ ` //  |  \/  ||   -| ||-  / //---`' 
|  /\  ||    | ||   | .  . ||   _| ||_  \ \\___   
|_// \_||    |_||   |_|\/|_||  /_____//  \_____|| 
`-`   `-`    `-`'   `-`  `-`   `-----`    `----`