Sheng, T., Goh, G., Tung, C., Wang, J. L., Cheng, J. K., & MICROELECTRONICS, I. O. (2014). FIB precision TEM sample preparation using carbon replica.
Chicago Style CitationSheng, T.T., G.P Goh, C.H Tung, John L.F Wang, Jeng Kou Cheng, and INSTITUTE OF MICROELECTRONICS. FIB Precision TEM Sample Preparation Using Carbon Replica. 2014.
MLA CitationSheng, T.T., et al. FIB Precision TEM Sample Preparation Using Carbon Replica. 2014.
Warning: These citations may not always be 100% accurate.