Lau, G., Tok, E., Wee, A., Liu, R., Lim, S., & SCIENCE, I. O. E. (2014). The investigation of surface topography development in Si(001) and Si(111) during SIMS depth profiling.

Lau, G.S., E.S Tok, A.T.S Wee, R. Liu, S.L Lim, and INSTITUTE OF ENGINEERING SCIENCE. The Investigation of Surface Topography Development in Si(001) and Si(111) During SIMS Depth Profiling. 2014.

Lau, G.S., et al. The Investigation of Surface Topography Development in Si(001) and Si(111) During SIMS Depth Profiling. 2014.