APA引文

Lau, G., Tok, E., Wee, A., Liu, R., Lim, S., & SCIENCE, I. O. E. (2014). The investigation of surface topography development in Si(001) and Si(111) during SIMS depth profiling.

Chicago Style Citation

Lau, G.S., E.S Tok, A.T.S Wee, R. Liu, S.L Lim, and INSTITUTE OF ENGINEERING SCIENCE. The Investigation of Surface Topography Development in Si(001) and Si(111) During SIMS Depth Profiling. 2014.

MLA引文

Lau, G.S., et al. The Investigation of Surface Topography Development in Si(001) and Si(111) During SIMS Depth Profiling. 2014.