Shen, C., Yang, T., Li, M., Wang, X., Foo, C., Samudra, G., . . . ENGINEERING, E. &. C. (2014). Fast Vth instability in HfO2 gate dielectric MOSFETs and its impact on digital circuits.

Shen, C., T. Yang, M.-F Li, X. Wang, C.E Foo, G.S Samudra, Y.-C Yeo, D.-L Kwong, and ELECTRICAL & COMPUTER ENGINEERING. Fast Vth Instability in HfO2 Gate Dielectric MOSFETs and Its Impact On Digital Circuits. 2014.

Shen, C., et al. Fast Vth Instability in HfO2 Gate Dielectric MOSFETs and Its Impact On Digital Circuits. 2014.