Chen, W., Loh, K., Lin, M., Liu, R., Wee, A., & SCIENCE, I. O. E. (2014). Atomic force microscopy study of hexagonal boron nitride film growth on 6H-SiC (0001).
Chicago Style CitationChen, W., K.P Loh, M. Lin, R. Liu, A.T.S Wee, and INSTITUTE OF ENGINEERING SCIENCE. Atomic Force Microscopy Study of Hexagonal Boron Nitride Film Growth On 6H-SiC (0001). 2014.
MLA引文Chen, W., et al. Atomic Force Microscopy Study of Hexagonal Boron Nitride Film Growth On 6H-SiC (0001). 2014.
警告:這些引文格式不一定是100%准確.