APA Citation

XINHUA, Z., & ENGINEERING, E. &. C. (2010). Characterization of electromigration defects using scanning thermal microscopy.

Chicago Style Citation

XINHUA, ZHENG, and ELECTRICAL & COMPUTER ENGINEERING. Characterization of Electromigration Defects Using Scanning Thermal Microscopy. 2010.

MLA Citation

XINHUA, ZHENG, and ELECTRICAL & COMPUTER ENGINEERING. Characterization of Electromigration Defects Using Scanning Thermal Microscopy. 2010.

Warning: These citations may not always be 100% accurate.