XINHUA, Z., & ENGINEERING, E. &. C. (2010). Characterization of electromigration defects using scanning thermal microscopy.
استشهاد بنمط شيكاغوXINHUA, ZHENG, و ELECTRICAL & COMPUTER ENGINEERING. Characterization of Electromigration Defects Using Scanning Thermal Microscopy. 2010.
MLA استشهادXINHUA, ZHENG, و ELECTRICAL & COMPUTER ENGINEERING. Characterization of Electromigration Defects Using Scanning Thermal Microscopy. 2010.
تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.