APA引文

XINHUA, Z., & ENGINEERING, E. &. C. (2010). Characterization of electromigration defects using scanning thermal microscopy.

Chicago Style Citation

XINHUA, ZHENG, and ELECTRICAL & COMPUTER ENGINEERING. Characterization of Electromigration Defects Using Scanning Thermal Microscopy. 2010.

MLA引文

XINHUA, ZHENG, and ELECTRICAL & COMPUTER ENGINEERING. Characterization of Electromigration Defects Using Scanning Thermal Microscopy. 2010.

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