APA引文

TJIOE, F., & ALLIANCE, S. (2019). Study of Transmission Electron Microscope Sample Preparations Using Focused Ion Beam.

Chicago Style Citation

TJIOE, FIDELIA, and SINGAPORE-MIT ALLIANCE. Study of Transmission Electron Microscope Sample Preparations Using Focused Ion Beam. 2019.

MLA引文

TJIOE, FIDELIA, and SINGAPORE-MIT ALLIANCE. Study of Transmission Electron Microscope Sample Preparations Using Focused Ion Beam. 2019.

警告：這些引文格式不一定是100％准確.