TJIOE, F., & ALLIANCE, S. (2019). Study of Transmission Electron Microscope Sample Preparations Using Focused Ion Beam.
استشهاد بنمط شيكاغوTJIOE, FIDELIA, و SINGAPORE-MIT ALLIANCE. Study of Transmission Electron Microscope Sample Preparations Using Focused Ion Beam. 2019.
MLA استشهادTJIOE, FIDELIA, و SINGAPORE-MIT ALLIANCE. Study of Transmission Electron Microscope Sample Preparations Using Focused Ion Beam. 2019.
تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.