TJIOE, F., & ALLIANCE, S. (2019). Study of Transmission Electron Microscope Sample Preparations Using Focused Ion Beam.
Chicago Style CitationTJIOE, FIDELIA, and SINGAPORE-MIT ALLIANCE. Study of Transmission Electron Microscope Sample Preparations Using Focused Ion Beam. 2019.
MLA CitationTJIOE, FIDELIA, and SINGAPORE-MIT ALLIANCE. Study of Transmission Electron Microscope Sample Preparations Using Focused Ion Beam. 2019.
Warning: These citations may not always be 100% accurate.