Xu, Z., BIN, S. Z., KUNDU, A., Yesilyurt, C., Sun, C., Chen, T., . . . ENGINEERING, E. A. C. (2019). Electronic transport properties of Weyl semimetals with strain-induced gauge fields. IOP PUBLISHING LTD.
Chicago Style CitationXu, Zhonghui, SIU ZHUO BIN, ANIRBAN KUNDU, Can Yesilyurt, Chi Sun, Tong Chen, MANSOOR BIN ABDUL JALIL, and ELECTRICAL AND COMPUTER ENGINEERING. Electronic Transport Properties of Weyl Semimetals With Strain-induced Gauge Fields. IOP PUBLISHING LTD, 2019.
MLA引文Xu, Zhonghui, et al. Electronic Transport Properties of Weyl Semimetals With Strain-induced Gauge Fields. IOP PUBLISHING LTD, 2019.
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