APA引文

CHEN, S., & ENGINEERING, E. &. C. (2010). Threshold voltage instabilities in MOS transistors with advanced gate dielectrics.

Chicago Style Citation

CHEN, SHEN, and ELECTRICAL & COMPUTER ENGINEERING. Threshold Voltage Instabilities in MOS Transistors With Advanced Gate Dielectrics. 2010.

MLA引文

CHEN, SHEN, and ELECTRICAL & COMPUTER ENGINEERING. Threshold Voltage Instabilities in MOS Transistors With Advanced Gate Dielectrics. 2010.

警告:這些引文格式不一定是100%准確.