APA引文

EE, L. S., & ENGINEERING, E. (2020). NEW TECHNIQUES FOR THE CHARACTERIZATION OF HOT-CARRIER DEGRADATION IN MOS DEVICES.

Chicago Style Citation

EE, LEANG SERN, and ELECTRICAL ENGINEERING. NEW TECHNIQUES FOR THE CHARACTERIZATION OF HOT-CARRIER DEGRADATION IN MOS DEVICES. 2020.

MLA引文

EE, LEANG SERN, and ELECTRICAL ENGINEERING. NEW TECHNIQUES FOR THE CHARACTERIZATION OF HOT-CARRIER DEGRADATION IN MOS DEVICES. 2020.

警告：這些引文格式不一定是100％准確.