أرسل هذا في رسالة قصيرة: NEW TECHNIQUES FOR THE CHARACTERIZATION OF HOT-CARRIER DEGRADATION IN MOS DEVICES

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| '--' ||  / //\ \\  `____ `   / //\ \\ |  \/  || 
| .--. || |  ___  || /___//   |  ___  ||| .  . || 
|_|| |_|| |_||  |_|| `__ `    |_||  |_|||_|\/|_|| 
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