發送短信 : NEW TECHNIQUES FOR THE CHARACTERIZATION OF HOT-CARRIER DEGRADATION IN MOS DEVICES

 _    _      ___      _  __     ___      ____    
| \  / ||   / _ \\   | |/ //   / _ \\   |  _ \\  
|  \/  ||  / //\ \\  | ' //   | / \ ||  | |_| || 
| .  . || |  ___  || | . \\   | \_/ ||  | .  //  
|_|\/|_|| |_||  |_|| |_|\_\\   \___//   |_|\_\\  
`-`  `-`  `-`   `-`  `-` --`   `---`    `-` --`