LINGFEI, W., THEAN VOON YEW, A., & ENGINEERING, E. A. C. (2020). Percolation theory based statistical resistance model for resistive random access memory. AIP.
استشهاد بنمط شيكاغوLINGFEI, WANG, AARON THEAN VOON YEW, و ELECTRICAL AND COMPUTER ENGINEERING. Percolation Theory Based Statistical Resistance Model for Resistive Random Access Memory. AIP, 2020.
MLA استشهادLINGFEI, WANG, AARON THEAN VOON YEW, و ELECTRICAL AND COMPUTER ENGINEERING. Percolation Theory Based Statistical Resistance Model for Resistive Random Access Memory. AIP, 2020.
تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.