Daurer, B. J., Sala, S., Hantke, M. F., Reddy, H. K. N., Bielecki, J., Shen, Z., . . . PHYSICS. (2022). Ptychographic wavefront characterization for single-particle imaging at x-ray lasers. The Optical Society.
Chicago Style CitationDaurer, Benedikt J., et al. Ptychographic Wavefront Characterization for Single-particle Imaging At X-ray Lasers. The Optical Society, 2022.
MLA引文Daurer, Benedikt J., et al. Ptychographic Wavefront Characterization for Single-particle Imaging At X-ray Lasers. The Optical Society, 2022.
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